Roy Clarke is the Marcellus L. Wiedenbeck Collegiate Professor of Physics and Applied Physics at the University of Michigan, Ann Arbor. He received his Ph.D. in Physics from Queen Mary College, University of London, UK. After a Fellowship at the Cavendish Laboratory, University of Cambridge, Prof. Clarke accepted the James Franck Fellowship at the University of Chicago and then joined the faculty of the University of Michigan. He was the founding director of the UM Applied Physics Program which celebrated its 25th year in 2012. He is a Fellow of the American Physical Society and in 2011 received a Presidential Award for Excellence in Mentoring.
Current research interests focus on nanoscience and technology, especially the structure and dynamics of epitaxial materials, including semiconductor quantum dots, magnetic nanostructures and oxide ferroelectrics. Clarke has also been active in entrepreneurial activities. A company he helped to create, k-Space Associates Inc., started as a research spin-off in 1992 and is now a leading supplier metrology tools to the semiconductor industry for in-situ, real-time monitoring of electronic device processing.
Hemant Dixit, Christianne Beekman , Christian M. Schlepütz , Wolter Siemons, Yongsoo Yang, Nancy Senabulya, Roy Clarke, Miaofang Chi, Hans M. Christen, and Valentino R. Cooper, "Understanding Strain-Induced Phase Transformations in BiFeO3 Thin Films", Adv. Sci. 2 1500041 (2015).
H.R. Sun, V.A. Stoica, M. Shtein, R. Clarke, K.P. Pipe, "Coherent Control of GHz Resonant Modes by an Integrated Acoustic Etalon", Phys. Rev. Lett., 110, 086109 (2013).
H. Zhou, R. Pindak, R. Clarke, D. Steinberg, and Y.Yacoby, “The limits of ultrahigh resolution x-ray mapping: estimating uncertainties in thin-film and interface structure determination using phase retrieval methods”, J. Phys. D 45 195302 (2012).
C.M. Schlepütz, Y. Yang, N.S. Husseini, R. Heinhold, H.-S. Kim, M.W. Allen, S.M. Durbin and R. Clarke, “The presence of a (1x1) oxygen overlayer on ZnO(0001) surfaces and at Schottky interfaces”, J. Phys.: Condens. Matter 24, 095007 (2012).
D. P. Kumah, S. Shusterman, Y. Paltiel, Y. Yacoby, R. Clarke, “Atomic-scale mapping of quantum dots formed by droplet epitaxy”, Nature Nanotechnology 4 835-838 (2009).
V.A. Stoica, Y.-M Sheu, D.A. Reis, and R. Clarke, “Wideband detection of transient solid-state dynamics using ultrafast fiber lasers and asynchronous optical sampling,” Optics Express 16, 2322 (2008).
E. Cohen, N. Elfassy, G. Koplovitz, S. Yochelis, S. Shusterman, D. P Kumah, Y. Yacoby, R. Clarke and Y. Paltiel, “Surface X-ray diffraction results of the III-V dot droplet heteroepitaxy growth process: recent understanding and open questions”, Sensors 11, 10624 (2011).
Y. Li, V. Stoica, L. Endicott, G. Wang, C. Uher and R. Clarke, “Coherent optical phonon spectroscopy studies of femtosecond-laser modified Sb2Te3 films”, Appl. Phys. Lett. 97, 171908 (2010).
M.F. DeCamp, D.A Reis, A. Cavalieri, P.H. Bucksbaum, R. Clarke, R. Merlin, E.M. Dufresne, D.A. Arms, A.M. Lindenberg, A.G. MacPhee, Z. Chang, B. Lings, J.S. Wark, S. Fahy, "Transient strain driven by a dense electron-hole plasma," Phys. Rev. Lett. 91 165502 (2003).
Y. Yacoby, M. Sowwan, E. Stern, J. Cross, D. Brewe, R. Pindak, J. Pitney, E.M. Dufresne, R. Clarke, “Direct determination of epitaxial interface structure in Gd2O3 passivation of GaAs”, Nature Materials 1, 99-101 (2002).
H. Baltes, Y. Yacoby, R. Pindak, R. Clarke, L. Pfeiffer, L. Berman, “Measurement of the diffraction phase in a 2D crystal”, Phys. Rev. Lett. 79, 1285 (1997).